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Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Resistance and Thickness Measuring Instrument 【EC-80SCAN】

Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments
  • Resistivity Thickness Meter

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